AQ7420 High-Resolution Reflectometer
Detects a reflection's position and measures its intensity
The AQ7420 accurately detects the quantity and location of reflections within optical connectors and modules. It reveals microcracks that standard loss measurements can miss, helping to avoid unpredictable and potentially detrimental failures, which is especially valuable in demanding environments subject to movement, vibration, and thermal cycling. When paired with the optional sensor head unit, it can also measure insertion loss simultaneously, making the AQ7420 the ideal multi-purpose instrument for inspecting optical connectors and modules.
Spurious noise reduction
With some conventional reflectometers, spurious noises may falsely appear in areas where there is no actual reflection. Waveform analysis often requires that users have specialized knowledge of this sort of phenomena. The AQ7420 greatly reduces spurious noises and simplifies analysis.
- Measurement distance: 100 mm (approx. 4 inches)
- Spatial resolution: 40 μm
- Spurious noise: −100 dB avoids false (ghost) effects
Simultaneous measurement of multiple reflection and Insertion loss
Traditionally, reflectometers have been inadequate for inspection of reflection attenuation due to poor measurement accuracy of the vertical axis (back reflection). The AQ7420 enables measurement with an uncertainty of ±３dB, and using the optical sensor head, connector connection loss can be measured simultaneously with an uncertainty of ±0.02 dB.
Microcrack analysis for optical connectors
The AQ7420 simultaneously measures breaks, cracks, losses, and reflections of optical connectors.
Measurement example of microcracks in optical connectors (high sensitivity range)
Brochures
- High-Resolution Reflectometer AQ7420 (611 KB)